Semiconductor Engineering

Part Average Test (PAT)

With semiconductor manufacturers producing huge amounts of data, it can be hard to guarantee quality and reliability, even with internal tools. Many companies outsource Part Average Testing (PAT) to a ...
Semiconductor Engineering

Part Average Testing (PAT)

Part Average Testing, or PAT, is used for outlier detection for a single measurement, a requirement for automotive electronics, found in the Automotive Electronics Councils‘ AEC – Q001 Rev-D ...